As part of this effort, Keith Lofstrom designed a test chip to test the new 1149.4 standard against real world constraints. The test chip and the standard are described in two papers presented at the 1996 International Test Conference:
K. Lofstrom, "A Demonstration IC for the P1149.4 Mixed Signal Test Standard", Proceedings of IEEE International Test Conference, October 1996, pages 92-98.
K. Lofstrom, "Early Capture for Boundary Scan Timing Measurements," Proceedings of IEEE International Test Conference, October 1996, pages 417-422.
Late news! "Early Capture ..." paper receives "honorable mention" from ITC! Honorable mention means "second best".
Both papers are available as pdf or postscript files here.