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TEST CHIP for the IEEE 1149.4 Standard
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The 1149.4 test chip is intended to test various features of the Dot4
standard on real silicon and on a real test board. The test chip contains:
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A 1149.1 four wire interface, with the optional RSTB pin.
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A digital input and output pin.
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Pins bringing out VH, VL, and Compare levels for external control. These
are normally tied to supply rails on chip.
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A differential set of Dot4 force and sense lines.
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Five different types of Dot4 boundary cell
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Two 100MHz differential amplifiers, one with Dot4 cells, one connected
straight to pins. These are the large rectangles in the middle of the drawing.
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Optional high speed differential comparators per pin.
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Internal analog probe points.
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Internal analog device measurement cells.
The test chip is a 4.0 x 2.5 mm, 40 pin IC fabricated in IMP
Semiconductor 's 1.2 micron dual metal N-well CMOS process.
Unfortunately, samples of the test chips are no longer available.
Matsushita also built a test chip, and those are used up, too. It's
about time for academia to build another one.
This chip generated two papers at the 1996
ITC.
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last revision Jan 23, 2008