Papers for downloading The following papers are available in postscript or pdf format.

These two papers were presented at the 1996 International Test Conference.  I copied these from the CD-ROM, which you can purchase from the IEEE Computer Society Press, ISBN #0-7803-3543-0. The tree-ware (hardbound) version is ISBN #0-7803-3541-4.

• K. Lofstrom, "A Demonstration IC for the P1149.4 Mixed Signal Test Standard", Proceedings of IEEE International Test Conference, October 1996, pages 92-98. (pdf - 138K)   (postscript - 344K)

• K. Lofstrom, "Early Capture for Boundary Scan Timing Measurements", Proceedings of IEEE International Test Conference, October 1996, pages 417-422. (pdf - 93K)   (postscript - 255K)

A paper about the Siidtech ICID cell at the 2000 Solid State Circuits conference:

• K. Lofstrom, W. Daasch, D. Taylor, "IC Identification Circuit using Device Mismatch", 2000 IEEE International Solid-State Circuits Conference Digest of Technical Papers Volume 43 - IEEE Cat. No. OOCH37056. (pdf - 59K) (postscript - 246K)

Using the ICID cell for yield improvement at LSI Logic :

• K. Lofstrom, D. Castaneda, B. Graff, A. Cabbibo, "ICID - Tracing Individual Die from Wafer Test through End-Of-Life" 2004 International Mixed Signal Test Workshop. (pdf - 310K)

• Not formally published, but a white paper available about SiidTech ICID: "ICID: A Robust, Low Cost Integrated Circuit Identification Method" v0.9 March 19, 2007 Keith Lofstrom, SiidTech (pdf - 870K)